/ Home
/ SUBMISSION

/ The BJNANO
/ Diamond Open Access
/ Journal Statistics
/ Editorial Board
/ Community
/ Call for papers

/ Latest Articles
/ Most accessed
/ Thematic issues
/ Volumes
/ Authors

/ Alerts

/ TWITTER
/ LINKEDIN
/ Mastodon
/ RSS FEED

Empty search

Article Type

Publication Date Range

Search Tips

This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.

Search Examples

aromatic	the word “aromatic”
aromatic aldehyde	the word “aromatic” OR “aldehyde”
+aromatic +aldehyde	both words “aromatic” AND “aldehyde”
+aromatic -aldehyde	the word “aromatic” but NOT “aldehyde”
“aromatic aldehyde”	the exact phrase “aromatic aldehyde”
benz*	words which begin with “benz”, such as “benzene” or “benzyl”
benz*yl	words that begin with “benz” and end with “yl”, such as “benzyl” or “benzoyl”
benzyl~	words that are close to the word “benzyl”, such as “benzoyl” (i.e., fuzzy search)

BROWSE
Latest Articles
Most accessed
thematic issues
volumes
authors

BROWSE

Latest Articles Most Accessed Thematic Issues Volumes Authors

Author

1 article(s) from Reshanov, Sergey

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Urs Gysin,
Thilo Glatzel,
Thomas Schmölzer,
Adolf Schöner,
Sergey Reshanov,
Holger Bartolf and
Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

PDF

Figure 1: a) Schematic view of the optical path allowing good visibility from the top to the tip–sample setup...

Jump to Figure 1

Figure 2: Additional two lenses optics which allows for the illumination of the tip–sample interface.

Jump to Figure 2

Figure 3: Coarse positioner and scan unit. Panel a shows the entire unit. In panel b the unit is stripped dow...

Jump to Figure 3

Figure 4: The atomic force microscope is assembled on a CF200 flange with four tension springs. Copper fins a...

Jump to Figure 4

Figure 5: A chromium grain embedded in a polycrystalline copper alloy. a) Measured with a confocal laser micr...

Jump to Figure 5

Figure 6: a) Topography, b) dark KPFM and c) 30% laser-power illuminated (470–480 nm and a maximum power of 5...

Jump to Figure 6

Figure 7: Panel a shows sections across the SiC p/n-junction (Figure 6) extracted from images taken at various light ...

Jump to Figure 7

Figure 8: Simultaneously acquired topography (a) and CPD (b) images of a silicon carbide JBS structure. The s...

Jump to Figure 8

Figure 9: a) Close view of the line sections from Figure 8e at the top layer of the structure, together with least-squ...

Jump to Figure 9

Album

Full Research Paper

Published 28 Dec 2015

Full text

Other Beilstein-Institut Open Science Activities

/ Help / Support & Contact / Alerts / Privacy Policy / Terms & Conditions / Impressum